Spatially Resolved TRPL Imaging of Laser-Patterned Perovskite Solar Mini Modules
Henry Halim a, Emilio Gutierrez-Partida a, Eugeny Ermilov a, Volker Buschmann a, Felix Koberling a, Jürgen Breitlow a, Rainer Erdmann a
a PicoQuant GmbH, Rudower Chaussee 29, Berlin, Germany
Proceedings of MATSUS Fall 2026 Conference (MATSUSFall26)
B5 Structure and Dynamics in Perovskites
Palma, Spain, 2026 October 26th - 30th
Organizer: Milos Dubajic
Oral, Henry Halim, presentation 119
Publication date: 22nd July 2026

Understanding carrier dynamics is crucial for developing advanced semiconductor materials and optoelectronic devices across fields: ranging from photovoltaics and light-emitting diodes to sensors and emerging quantum materials. While steady-state photoluminescence (PL) techniques provide valuable information on optical quality, they often fall short in revealing the full picture of how charge carriers recombine, migrate and interact with local defects.

Time-resolved photoluminescence (TRPL) and lifetime imaging techniques offer deeper insights by resolving carrier lifetimes, recombination pathways, and diffusion behavior with high temporal and spatial resolution. Combining TRPL with intensity-dependent measurements help untangle radiative and non-radiative processes and can quantify how excitation conditions influence carrier transport, key parameters for optimizing material design and device performance.

In this contribution, we demonstrate how PicoQuant’s Solira TRPL microscope system enables detailed characterization of carrier diffusion and recombination dynamics in a wide range of semiconductor materials. Using hybrid perovskites as a showcase, given their broad relevance from photovoltaics to photodetectors, we illustrate how time- and space-resolved PL mapping can connect structural heterogeneity to electronic behavior. The same approach is applicable to diverse materials such as III-V semiconductors, 2D materials, quantum dots, and organic semiconductors.

This flexible measurement platform supports researchers aiming to optimize fabrication processes, reveal defect-related loss channels, and better understand fundamental transport mechanisms, all essential steps for advancing next-generation optoelectronic devices and functional materials.

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