Publication date: 22nd July 2026
Perovskite photovoltaics (PVs) have already demonstrated remarkable efficiency potential at low-cost owing to their excellent optoelectronic properties. However, high density of mobile ionic effects, with various electronic and chemical processes occurring over a broad range of timescales, can significantly affect long-term stability of perovskite. Deconvoluting and understanding these dynamic processes are challenging because they can strongly influence one another. Conventional frequency-domain characterization techniques, such as impedance spectroscopy (IS), intensity-modulated photovoltage spectroscopy (IMVS), and intensity-modulated photocurrent spectroscopy (IMPS), are widely used to investigate these processes1. However, these techniques are limited to operational devices, and their signals can be influenced by contacts and interfacial effects.
As an alternative, intensity-modulated photoluminescence spectroscopy (IMPLS) has been shown to be a fully optical, contactless technique capable of probing dynamic processes across a broad frequency range2. However, a systematic interpretation of IMPLS must be established to unlock its full potential. Therefore, in this work, by correlating IMPLS spectrum with the spectral features of optoelectrical techniques such as IS, IMVS, and IMPS analytically, numerically, and experimentally, we establish a physical framework to interpret IMPLS spectra in complete solar cells. This study reveals that IMPLS can provide the same information as electrical techniques and can reconstruct electrical signals fully optically. Therefore, this work highlights the potential of IMPLS as a powerful optical diagnostic tool for studying dynamic processes and predicting the intrinsic properties of materials by monitoring differential photoluminescence.
This research is performed at the NWO institute AMOLF, carried out by SolarLab part of SolarNL, a national research, innovation and industrial development program funded by the Netherlands National Growth Fund.
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