Proceedings of MATSUS Fall 2026 Conference (MATSUSFall26)
Publication date: 22nd July 2026
This work covers the method of tomographic photoconductive atomic force microscopy (TPC-AFM) was employed for the purpose of investigating the bulk of triple cation lead halide perovskites.
In combination with time resolved heterodyne Kelvin probe force microscopy (KPFM), residual lead iodide sites are identified and with tomography spatially resolved. The tomographic AFM method works by physical milling of the sample, delivering XY-Scans frame by frame while digging into the sample in Z-direction. The result is a 3D resolved map of the photocurrent on a nm scale. Furthermore, the milling interaction polishes the sample and continuously provides a fresh measurement for the simultaneous photocurrent measurement. Lead iodide residuals in the film could be identified using top surface conductive AFM measurements and KPFM measurements to identify the conductivity and work function of individual grains. Lead iodide residuals show low conductivity and high workfunction. TPC-AFM can track the position of such low conductivity grains and reveals them to be present, only on the interface of the sample. In the bulk of the perovskite no residuals are found, while the photocurrent contrast at grain boundaries remains high.
Overall, TPC-AFM is a powerful accessible method to investigate electrical properties inside the bulk of semiconducting materials, enabling the 3D resolution of residuals and defects.
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