Luminescence-Based Detection of Local Shunts and Defects and their Impact on Performance and Aging of Large-scale Perovskite Solar Devices
Alexandra Levtchenko a, Marion Provost a, Karim Medjoubi a, Liam Gollino a, Yves Abou-Khalil a, Jean Rousset b, Daniel Ory b, Thomas Guillemot a
a Institut Photovoltaïque d'Île-de-France (IPVF, CNRS UMR9006), 18 Boulevard Thomas Gobert, 91120, Palaiseau, France
b EDF R&D, 18 Boulevard Thomas Gobert, 91120 Palaiseau, France
Materials for Sustainable Development Conference (MATSUS)
Proceedings of MATSUS Fall 2026 Conference (MATSUSFall26)
A1 Beyond Efficiency: Perovskite Optoelectronics for Scalable and Stable Devices
Palma, Spain, 2026 October 26th - 30th
Organizers: Guixiang Li and Silver-Hamill Turren-Cruz
Poster, Alexandra Levtchenko, 527
Publication date: 22nd July 2026

While large-size perovskite-based solar module demonstrators are beginning to appear in the photovoltaics community, optical methods such as luminescence reveal that tiny micro- or millimeter-scale defects can still form during large-scale deposition processes(a-c). The aim of our work is to evaluate the extent to which these defects affect macroscopic device performance and aging, depending on their characteristics. Since the electrical characteristics of individual cells cannot be assessed within a module, we designed and fabricated rectangular cells (8 cm × 4 mm) from the same substrate that underwent all deposition steps, mimicking the geometry of the cells in our mini-module(64cm²,d). We performed a set of advanced luminescence-based imaging techniques on these samples, including absolutely calibrated hyperspectral photoluminescence (PL), electroluminescence (EL), intensity-dependent PL, and PL under short-circuit conditions(e-i). We demonstrate that these different methods can be complementary and provide insights into defect characteristics, depending on their area of influence. We then evaluate their impact on quasi-Fermi level splitting and individual IV curves(j-l). We also performed a contactless, layer-by-layer PL characterization - similar to what could be done in an in-line quality control process - to detect at which process step the various defects may appear. Current work involves 2D spatial modeling of experimental results, particularly the high ideality factors of defective cells accompanied by reduced open-circuit voltage (Voc) and fill factor (FF) in IV curves(k-l). By continuing to physically isolate the defective regions through vertical laser scribing(m-n), we observed that the overall FF of the rectangular cell corresponds to the average FF of the isolated regions, while local Voc variations have a weaker impact on the overall value(o-p). Another aspect of the ongoing work involves evaluating the impact of such defects on cell aging and linking the results to the behavior of similar defects in module configurations. 

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