Proceedings of September Meeting 2016 (NFM16)
Publication date: 14th June 2016
Charge carrier losses occurring on all time scales from femtoseconds to seconds severely limit the water splitting performance of most photocatalytic systems. In search of better semiconductor absorber materials characterization of carrier lifetime and carrier transport is essential for a fundamental understanding and feedback to material preparation to discriminate between prospective (good and bad) candidates [1-4] at an early development stage. Time-resolved laser spectroscopy is utilized to unravel the nature of macroscopic and microscopic charge carrier transport and competing recombination processes in bare photoabsorbers and fully assembled photo-electrochemical cells. A complementary approach is employed combining sub-picosecond to nanosecond conductivity (Terahertz, microwave), transient absorption/reflectivity, femtosecond-resolved two-photon photoemission and luminescence measurements to provide an in-depth overview of bulk and interfacial the carrier processes. With these techniques charge carrier dynamics (trapping, polaron transport, polaron-phonon coupling) is studied in a selection of different materials like BiVO4, TaON, Cu2O and recently discovered materials such as FeCrAl-Ox.
[1] F. F. Abdi, T. J. Savenije, M. May, B. Dam, R. van de Krol, J. Phys. Chem. Lett. 4, 2752 (2013)
[2] K. Skorupska, P. A. Maggard, R. Eichberger, K. Schwarzburg, P. Shahbazi, B. Zoellner, B. A. Parkinson, ACS Comb. Sci., 17, 742 (2015)
[3] A. J. Cowan, J. R. Durrant, Chem. Soc. Rev. 42, 2281 (2013)
[4] J. Ravensbergen, F. F. Abdi, J. H. van Santen, R. N. Frese, B. Dam, R. van de Krol, J. T. M. Kennis, J. Phys. Chem. C, 118, 27793 (2014)
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