Proceedings of September Meeting 2016 (NFM16)
Publication date: 14th June 2016
This talk will present methods to characterize charge transport in semiconducting thin films made of nanocrystals (NCs) and example findings from these measurements on lead sulfide (PbS) NC thin films. The techniques discussed will include time-of-flight (TOF) measurements of mobility [1], thermal admittance spectroscopy (TAS) to quantify trap states and attempt frequencies [2], and temperature-dependent current-voltage characterization to develop a model for charge transport [3]. Performing these measurements as a function of PbS NC size enables validation of the analytical models behind the interpretation of the measurement data. Complementing these measurements with fundamental studies and simulation [4] enables us to understand the performance of NC-based devices from the atomic level and propose improvements to materials chemistry and device design.
[1] N. Yazdani, D. Bozyigit, O. Yarema, M. Yarema, V. Wood. “Hole Mobility in Nanocrystal Solids as a Function of Constituent Nanocrystal Size” Journal of Physical Chemistry C 5 (2014).
[2] D. Bozyigit, S. Volk, O. Yarema, and V. Wood. “Quantification of Deep Traps in Nanocrystal Solids, their Electronic Properties, and their Influence on Device Behavior” Nano Letters 13 (2013).
[3] D. Bozyigit, W. Lin, N. Yazdani, O. Yarema, V.Wood. “A Quantitative Model for Charge Transport, Trapping, and Recombination in Nanocrystal Solids” Nature Communications 6 (2015).
[4] D. Bozyigit, N. Yazdani, M. Yarema, O. Yarema, W. M. M. Lin, S. Volk, K. Vuttivorakulchai, M. Luisier, F. Juranyi, V. Wood. “Soft Surfaces make Phonon Interactions Strong” Nature 531 (2016).
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