Proceedings of nanoGe Fall Meeting19 (NFM19)
DOI: https://doi.org/10.29363/nanoge.nfm.2019.065
Publication date: 18th July 2019
Ferroelectric materials possess spontaneous polarization that can be switched by an electric field and can be used for multiple applications such as information technologies and energy harvesting devices. The existence of the ferroelectricity has been macroscopically examined by measuring polarization charge based on the detection of switching current. However, a local probing of polarization charge at the nanoscale is necessary for further applications of the ferroelectric materials because smaller and thinner materials and devices have been of significant interest. Although piezoresponse force microscopy (PFM) has been used extensively for this purpose, it was recently revealed that non-ferroelectric effects can additionally contribute to the PFM signal. In this presentation, I will summarize our recent effort on the local probing of the polarization charge based on the conductive atomic force microscopy (AFM) by combination of positive-up-negative-down method, so called AFM-PUND. In particular, fast local probing of the polarization charge will be discussed because the amount of switching current is increasing according to the increase of the frequency, indicating that smaller polarization charge can be measured by faster probing. These results could provide a new guideline for examining the existence of the ferroelectricity at nanoscale. Moreover, the present results could be further extended for probing other electrical properties such as capacitance and dielectric constant.
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