Proceedings of MATSUS Fall 2026 Conference (MATSUSFall26)
Publication date: 22nd July 2026
Photoluminescence (PL) intermittency, commonly referred to as blinking, is a well-established phenomenon in single-photon emitters. However, in perovskite materials, a promising candidate for solar cell technologies, this behaviour has been seen across various morphologies, including thin films employed in optoelectronic devices. In this material, PL blinking is intrinsically linked to charge-carrier transport, radiative and nonradiative recombination pathways, and the presence of traps and defects within the material. At Hofkens lab, we recently developed a correlation clustering approach which clusters pixels correlated in intensity fluctuations in metal halide perovskite films. This enables the extraction of grain-level structural information comparable to scanning electron microscopy, alongside local photophysical properties. Here we present an extension to this methodology through time-lapse correlation imaging, which aims to mitigate problems arising when measuring PL behaviour of perovskite films. Due to the soft and dynamic nature of the perovskite material, the local photophysics can change in time and therefore during measurement of the PL. By dividing measurements into consecutive time windows and performing comparative correlation analysis, we obtain correlation maps as a function of time, revealing spatiotemporal changes in correlated domains and fluctuation regimes. This algorithm is used to characterize the relationship between perovskite morphology, such as grain size and composition, and its evolving blinking dynamics. Owing to its non-invasive nature, the method can be applied to in-operando devices to monitor changes in photophysical behavior under different solar cell operating conditions.
The presenter acknowledges the support of the Research Foundation-Flanders (FWO, K257023N).
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