A simple question, many answers: how many ions migrate through perovskite solar cells?
Bruno Ehrler a
a NWO-Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands
Proceedings of Perovskite Semiconductors: From Fundamental Properties to Devices (PerFunPro)
Konstanz, Germany, 2025 September 8th - 10th
Organizers: Lukas Schmidt-Mende, Vladimir Dyakonov and Selina Olthof
Invited Speaker, Bruno Ehrler, presentation 025
Publication date: 9th July 2025

Mobile ions are a key contributor to the degradation and instability of metal halide perovskite solar cells. Accurately quantifying their properties—such as density, mobility, and activation energy—is essential for understanding and mitigating their impact on device performance. While electrical techniques like impedance spectroscopy, fast current-voltage scans, and transient measurements are commonly used for this purpose, their interpretation often relies on assumptions about the device, and they always measure the whole stack at once. As a result, reported values for ion-related parameters vary widely across the literature.

In this talk, I will highlight the limitations of relying on individual electrical techniques and demonstrate how a combined approach—integrating multiple electrical measurements with drift-diffusion simulations—provides a more reliable and comprehensive picture of mobile ion behavior. Additionally, I will introduce a complementary optical method that enables the quantification of ion migration in perovskite layers before contact deposition, offering new opportunities for studying ion dynamics in half-stacks and individual films.

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