Mapping Carrier Dynamics: Combining Time-Resolved Photoluminescence and Spatial Imaging for Advanced Semiconductor Research
Emilio Gutierrez-Partida a, Eugeny Ermilov a, Volker Buschmann a, Christian Oelsner a, Felix Koberling a, Jürgen Breitlow a, Rainer Erdmann a
a PicoQuant GmbH, Rudower Chaussee 29, Berlin, Germany
Proceedings of Perovskite Semiconductors: From Fundamental Properties to Devices (PerFunPro)
Konstanz, Germany, 2025 September 8th - 10th
Organizers: Lukas Schmidt-Mende, Vladimir Dyakonov and Selina Olthof
Poster, Emilio Gutierrez-Partida, 057
Publication date: 16th July 2025

Understanding carrier dynamics is crucial for developing advanced semiconductor materials and optoelectronic devices across fields ranging from photovoltaics and light-emitting diodes to sensors and emerging quantum materials. While steady-state photoluminescence (PL) provides valuable information on optical quality, it often falls short in revealing the full picture of how charge carriers recombine, migrate, and interact with local defects.

Time-resolved photoluminescence (TRPL) and lifetime imaging techniques offer deeper insights by resolving carrier lifetimes, recombination pathways, and diffusion behavior with high temporal and spatial resolution. Combining TRPL with intensity-dependent measurements helps disentangle radiative and non-radiative processes and quantify how excitation conditions influence carrier transport, key parameters for optimizing material design and device performance.

In this contribution, we demonstrate how PicoQuant’s MicroTime 100 confocal TRPL microscope system enables detailed characterization of carrier diffusion and recombination dynamics in a wide range of semiconductor materials. Using hybrid perovskites as a showcase, given their broad relevance from photovoltaics to photodetectors, we illustrate how time- and space-resolved PL mapping can connect structural heterogeneity to electronic behavior. The same approach applies to diverse materials such as III-V semiconductors, 2D materials, quantum dots, and organic semiconductors.

This flexible measurement platform supports researchers aiming to optimize fabrication processes, reveal defect-related loss channels, and better understand fundamental transport mechanisms, all essential steps for advancing next-generation optoelectronic devices and functional materials.

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