Publication date: 16th July 2025
Perovskite solar cells consist in stacks of different layers acting synergistically to produce electricity. Understanding the interplay between all these different layers and their interfaces during working conditions becomes crucial to address targeted device optimization related to the actual problematic layers.
Kelvin Probe Force Microscopy measures carried out on the cross section of devices enable imaging of the surface potential for all the different layers of the solar cell simultaneously, giving insights into charge carrier dynamics and ionic motion during operation. This type of measurements enables spatial and temporal resolution of inhomogeneities in charge carrier transport within the device.
However, cross section preparation targeted specifically for Scanning Probe Microscopy techniques becomes vital to get consistent experimental data, which are free from topographic cross-talk. From the cleavage process to the ion polishing, every step exhibits challenges due to the constant possibility of damaging the cross section before the actual measurements. Therefore, establishing a non-damaging, rigorous and versatile procedure for cross section preparation and subsequent KPFM measures becomes vital to get meaningful experimental data and consequently true insights into the operation of perovskite solar cells.