Publication date: 16th July 2025
In this work, conductive atomic force microscopy (C-AFM) has been utilized to investigate the photoactive properties of perovskite thin films.
The films, which were prepared by Bekele Teklemariam, feature a control sample and two more treated films. The full samples consist of a glass/HTL/perovskite stack.
The samples have been compared in their crystallographic makeup using topography measurements of the perovskite surface layer. Furthermore, the current generated by the photoactive layer has been measured. Conductivity measurements in the dark and under illumination have been performed for all films.
Both treated samples show noticeably increased dark- and photocurrents compared to the control. This coincides with the rather high current measured for the full solar cells produced from these films. Especially the grains which show no photoactivity in the current measurements are an interesting measure. On the surface, the control samples showed with 41.4% a rather high portion of dead grains over the entire film surface. The coverage of photoactive grains was much higher for both the treated samples, with below 12% of the grains showing no photocurrent under illumination.
Overall, the C-AFM technique gives insights, on a nanoscale, into why the full perovskite solar cells perform much better with their respective treatments.
For future investigations, coupling photocurrent with photovoltage mapping can give a more detailed look on what is causing increased photovoltaic performance in individual grains.
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